Research in VLSI Circuit Testing, Verification, and Diagnosis

The University of Illinois at Urbana-Champaign


keywords: VLSI circuit testing, CAD, test generation, fault simulation, fault diagnosis, design for testability, design verification, electronic design automation

IGATE is a test generation and diagnosis system based on Genetic Algorithms (GAs) being developed at the University of Illinois' Center for Reliable and High Performance Computing. This project involves research and development in the areas of automatic test generation and fault diagnosis for the large chips envisioned by the high performance computing and communications industry. The test generator developed will be able to handle industrial chips with greater than one million transistors and containing complex design features, such as multiple clocks, internally derived clocks, gated clocks, mixed positive and negative clocking, a mix of latches and flip-flops, asynchronous logic, embedded RAMs, ROMs, and bidirectional switches. The project is being funded by the Advanced Research Projects Agency (ARPA), by the Semiconductor Research Corporation (SRC), and by Hewlett-Packard.

IGATE Research

Test Generation
Fault Simulation
Design for Testability
Delay Fault Testing
Testability Measures
Fault Diagnosis
Bridge Fault Testing
Memory & Iterative Logic Array Testing
Power Estimation
Design Verification

Project Members


Genetic Algorithm Example

CAD Tools Available

Test Vectors Available

Benchmark Circuits Available

HP 83000 F330 IC Tester

Last Updated: August 29, 2000
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