ATOM Test Vectors
The ATOM combinational circuit ATPG system is described in the
following paper:
-
New Techniques for Deterministic Test Pattern Generation,
Ilker Hamzaoglu and
Janak H. Patel,
Proceedings of the VLSI Test Symposium, pp. 446-452, April 1998.
Test Vectors:
- Vectors generated by ATOM using fault simulation.
- Vectors generated by ATOM without using fault simulation, i.e. the test set for a given circuit contains one vector for each detectable fault in that circuit.
Note: The test sets generated by ATOM for all the ISCAS circuits have 100% fault coverage.
Last Updated: May 6, 1998
Send any questions to hamza@crhc.uiuc.edu