MINTEST Test Vectors for Full Scan Circuits under Transition Fault Model
The MINTEST combinational circuit test generator for transition faults
is described in the following paper:
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Compact Two-Pattern Test Set Generation for Combinational and Full Scan Circuits,
Ilker Hamzaoglu and
Janak H. Patel,
Proceedings of the International Test Conference, October 1998.
Last Updated: November 30, 1999
Send any questions to hamza@crhc.uiuc.edu