OPUS: A Partial Scan Package
OPUS is a gate-level, partial scan package for sequential
circuits. It was designed to be used with the HITEC/PROOFS test generation
and fault simulation package. Version 1.2 is currently being distributed to
non-profit educational institutions only. (Others please contact
Prof. Janak Patel for access.)
Programs in the OPUS tool set were designed to run under the Unix environment
and have been compiled for both HP and SUN workstations. They are available
to the public on an internal-use-only basis. The programs modify circuits
described in the
ISCAS89 benchmark
format.
Acknowledgement
The development of these tools was supported by the Semiconductor Research
Corporation.
Copyright © 1995 by the University of Illinois. All rights reserved.
Last Updated: September 10, 1997
Send any questions to liz@uiuc.edu