IGATE Research on Testability Measures

Key Contributors

• Janak Patel
• Jaushin Lee
• Susheel Chandra

Research Papers

A listing of all published IGATE research papers on testability measures is included below.

Theory and practice of sequential machine testing and testability,
Irith Pomeranz, Sudhakar M. Reddy, and Janak H. Patel,
Proceedings of the International Symposium on Fault Tolerant Computing, pp. 330-337, June 1993.

Testability analysis based on structural and behavioral information,
Jaushin Lee and Janak H. Patel,
Proceedings of the IEEE VLSI Test Symposium, pp. 139-145, April 1993.

Experimental evaluation of testability measures for test generation,
Susheel J. Chandra and Janak H. Patel,
IEEE Transactions on Computer-Aided Design of Circuits and Systems, vol, 8, no. 1, pp. 93-97, January 1989.

Effectiveness of heuristic measures for automatic test pattern generation,
Sanjaykumar T. Patel and Janak H. Patel,
Proceedings of the ACM/IEEE Design Automation Conference, pp. 547-552, July 1986.